Light Scattering in Microcrystalline Silicon Thin Film Cells
نویسندگان
چکیده
Different optical characterization methods were applied to a series of microcrystalline silicon thin films, either as grown, textured, or subsequently polished, mirror-like. They reveal contributions of bulk and surface light scattering effects to the phenomenon of optical absorption enhancement. The enhanced light absorption in textured layers is mainly due to a longer optical path as a result of an efficient diffuse light scattering at the textured film surface. Root mean square surface roughness of about 40nm is sufficient for completely diffusive scattering of silicon/metal back reflector.
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تاریخ انتشار 1999